Aberration-corrected quantum temporal imaging system
نویسندگان
چکیده
منابع مشابه
Aberration corrected emittance exchange
The MIT Faculty has made this article openly available. Please share how this access benefits you. Your story matters. Full exploitation of emittance exchange (EEX) requires aberration-free performance of a complex imaging system including active radio-frequency (rf) elements which can add temporal distortions. We investigate the performance of an EEX line where the exchange occurs between two ...
متن کاملPupil-phase optimization for extended-focus, aberration-corrected imaging systems
The insertion of a suitably designed phase plate in the pupil of an imaging system makes it possible to encode the depth dimension of an extended three-dimensional scene by means of an approximately shift-invariant PSF. The so-encoded image can then be deblurred digitally by standard image recovery algorithms to recoup the depth dependent detail of the original scene. A similar strategy can be ...
متن کاملfast multicolor 3 d imaging using aberration - corrected multifocus microscopy
60 | VOL.10 NO.1 | JANUARY 2013 | nature methods fluorescence microscopy using beam splitters to image up to four focal planes on separate cameras3. This method provides excellent light efficiency and a large lateral field of view corresponding to the entire surface area of the camera chip. However, refocusing by translating the camera away from the nominal focal plane induces spherical aberrat...
متن کاملThe Versatile Imaging Capabilities of Aberration-Corrected STEM
The recent advancement in aberration-corrected electron microscopy, especially aberration-corrected STEM (AC-STEM), makes it possible to routinely extract atomic scale information of a variety of solid materials. With the availability of sub-angstrom size electron probes and the appropriate selection of detectors one can extract useful information on the atomic structure, chemical composition, ...
متن کاملAberration-corrected precession electron diffraction
Precession electron diffraction (PED) is a promising technique for collecting high quality diffraction patterns for rapid nanoscale structural characterization [1]. It is able to reduce dynamical scattering effects, improving the interpretability of diffraction intensities over those obtained by conventional electron diffraction techniques. When used on a microscope that can produce a fine prob...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Physical Review A
سال: 2013
ISSN: 1050-2947,1094-1622
DOI: 10.1103/physreva.87.043808